Anhui Jianzhu University, China
Author Profile
ORCID
🎓 Early Academic Pursuits
Born in Heze, Shandong Province, China, Dr. Pengxiang Ge began his journey in science and technology with a deep-rooted curiosity about automation and precision engineering. His academic path reflects a steady climb through rigorous disciplines and institutions, each stage shaping his intellectual identity.
His undergraduate studies at Yantai Nanshan University (2011–2015) laid the foundation in Electrical Engineering and Automation, equipping him with technical skills and logical reasoning. Motivated to explore advanced technologies, he pursued a Master’s degree in Detection Technology & Automatic Equipment at Anhui University (2016–2019), under the guidance of Prof. Guihua Li. This period proved pivotal, as he delved into data acquisition systems and sensor-based technologies, eventually spearheading a graduate innovation project that designed a wireless data transmission module using STM32—a testament to his early promise as a researcher.
Dr. Ge’s doctoral work at Hefei University of Technology (2020–2023) in Instrument Science and Technology, supervised by the renowned Prof. Yonghong Wang, further refined his expertise. Here, he immersed himself in cutting-edge research in Digital Image Correlation (DIC) and optical precision metrology, marking the beginning of a journey that would bridge academic theory with real-world applications.
👨🏫 Professional Endeavors
After earning his Ph.D., Dr. Ge transitioned seamlessly into academia. In August 2023, he assumed the role of Associate Professor at the Department of Control Engineering, Anhui Jianzhu University. There, he teaches both undergraduate and graduate students in courses such as Motion Navigation & Path Planning, Image Inspection Technology, System Identification, and Modern Sensors & Testing Technology. Beyond teaching, Dr. Ge supervises graduate research—mentoring two direct M.S. students and co-advising five more from Anhui University—thus nurturing the next generation of innovators in instrumentation science.
Before this appointment, Dr. Ge gathered valuable practical experience. Notably, he worked as a Research Assistant at the Changjiang Scholar Full-field Optical Measurement Laboratory, contributing to a high-impact project that developed 3D DIC deformation measurement techniques for smartphone drop testing. Briefly, in 2019, he also served as a Software Development Engineer at MacroSAN Technologies Co., Ltd., where he trained in VMware and Linux, gaining insights into industry-grade software and systems integration.
🔬 Contributions and Research Focus
Dr. Ge’s research stands at the intersection of machine vision, optical metrology, and digital image correlation (DIC)—fields central to modern engineering innovation. His scholarly contributions include work on mirror-assisted DIC multiview calibration, point cloud optimization, and full-field optical inspection for complex geometries.
He is currently leading or participating in several major funded projects. As Principal Investigator, he is directing research on multi-camera DIC-based deformation measurement for large components—a project that aligns with national interests in manufacturing and structural safety. As a collaborator, he contributes to projects on reservoir safety monitoring, 3D speckle measurement under extreme conditions, and semiconductor inspection, showcasing a versatile portfolio that spans civil, industrial, and electronic engineering domains.
His work has been disseminated in reputed journals such as Measurement, where he recently published a study on high-precision calibration methods for multiview DIC systems.
🏆 Accolades and Recognition
Dr. Ge’s exceptional academic and research excellence has been widely recognized. In 2022, he received the Excellent Paper Second Prize at the National Forum for Doctoral Students in Instrument Science & Technology—a significant milestone affirming the impact of his research among peers. The same year, he earned the Best Presentation Award at the Meishan International Young Scholars Forum hosted by Beihang University in Ningbo.
His consistent academic performance has also earned him two National Scholarships from the Ministry of Education of China—a highly selective honor awarded to top-ranking students. Other recognitions include being named an Outstanding Graduate and a Merit Student during his master’s years at Anhui University.
🌍 Impact and Influence
As a scholar and mentor, Dr. Pengxiang Ge is emerging as a thought leader in precision measurement technologies. His expertise is increasingly sought after in interdisciplinary collaborations, particularly in areas requiring the integration of image processing, sensors, and real-time data acquisition systems. His contribution to mobile device testing, reservoir deformation monitoring, and semiconductor inspection demonstrates his ability to translate lab research into societal and industrial impact.
Dr. Ge also inspires young scholars through his teaching and graduate supervision. His dual role as an educator and innovator amplifies his influence within the academic ecosystem.
🌟 Legacy and Future Contributions
Dr. Pengxiang Ge’s trajectory points toward a lasting legacy in instrumentation science and optical metrology. As technologies such as AI-driven machine vision, digital twins, and smart sensing continue to evolve, his work on high-precision DIC systems will remain at the forefront of innovation.
Looking ahead, Dr. Ge is expected to continue pioneering solutions for real-time structural monitoring, non-invasive inspection systems, and automated defect detection. His research bridges scientific rigor with technological relevance—positioning him as a vital contributor to China’s ambitions in high-tech development and smart manufacturing.
With a solid foundation in theory, practice, and mentorship, Dr. Ge’s impact will continue to expand—both through his research outcomes and the students he shapes for the future.
📝Notable Publications